An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits - Altaf-ul-Amin, Md. (Bangi : Fakulti Kejuruteraan, Universiti Kebangsaan Malaysia, 1999)
Thesis (M.Sc.) - Universiti Kebangsaan Malaysia, 1999
References: p. 106-109
Keywords: Integrated circuits -- Very large scale integration -- Testing; Iddq testing; Metal oxide semiconductors, Complementary -- Testing