TY  - BOOK
AU  - Venkataraman,Srikanth
TI  - BIST based on reseeding of LFSRs
PY  - 1993///
CY  - Montreal
PB  - McGill University
KW  - Digital integrated circuits
KW  - Testing
KW  - Integrated circuits
KW  - Very large scale integration
N1  - Thesis (Master of Engineering) - McGill University, Montreal, 1993
ER  -