Venkataraman, Srikanth <br/><br/>
BIST based on reseeding of LFSRs / 
Srikanth Venkataraman 
 - Montreal :  McGill University,  1993 
 - ix, 96 p. :  ill. ;  29 cm. 
<br/><br/>Thesis (Master of Engineering) - McGill University, Montreal, 1993 
<br/><br/><label>ISBN: </label> RM147.20 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital integrated circuits--Testing<br/>Integrated circuits--Very large scale integration--Testing