TY  - BOOK
AU  - Moore,Will
AU  - Maly,Wojciech
AU  - Strojwas,Andrzej
ED  - International Workshop on Designing for Yield (1987 : Oxford, England)
TI  - Yield modelling and defect tolerance in VLSI: papers presented at the International Workshop on Designing for Yield, Oxford 1-3 July 1987
SN  - 085274398x
PY  - 1987///
CY  - Bristol
PB  - Adam Hilger
KW  - Electronic apparatus and appliances
KW  - Design and constructio n
KW  - Electronic industries
KW  - Equipment and supplies
ER  -