Yield modelling and defect tolerance in VLSI papers presented at the International Workshop on Designing for Yield, Oxford 1-3 July 1987 - Moore,Will; Maly, Wojciech; Strojwas, Andrzej; International Workshop on Designing for Yield (1987 : Oxford, England) (Bristol Adam Hilger, 1987)
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Keywords: Electronic apparatus and appliances -- Design and constructio n; Electronic industries -- Equipment and supplies