Yield modelling and defect tolerance in VLSI  papers presented at the International Workshop on Designing for Yield, Oxford 1-3 July 1987 
edited by Will Moore, Wojciech Maly and Andrzej Strojwas 
 - Bristol  Adam Hilger  1987 
 - vi, 282 p. : ill. ; 24 cm. 
<br/><br/><label>ISBN: </label>085274398x 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic apparatus and appliances--Design and constructio n<br/>Electronic industries--Equipment and supplies