X-ray microscopy :  proceedings of the International Symposium, Gottingen, Fed. Rep. of Germany, September, 14-16, 1983 / 
edited by G. Schmahl and D. Rudolph 
 - Berlin :  Springer-Verlag,  1984 
 - 345 p. :  ill. ;  24 cm. 
 - Springer series in optical sciences;  43 .
<br/><br/>Includes bibliographies references 
<br/><br/><label>ISBN: </label>3540132716 
<br/><br/><label>Subjects--Topical Terms: </label><br/>X-ray Microscope--Congresses