TY  - BOOK
AU  - Ahmed,Iftekhar
TI  - VLSI circuit testing using probabilistic approach
PY  - 1995///
CY  - Bangi
PB  - Universiti Kebangsaan Malaysia
KW  - Integrated circuits
KW  - Large scale integration
N1  - Thesis (Doctor of Philosophy) - Universiti Kebangsaan Malaysia, 1995
ER  -