Ahmed, Iftekhar <br/><br/>
VLSI circuit testing using probabilistic approach 
Iftekhar Ahmed 
 - Bangi  Universiti Kebangsaan Malaysia  1995 
 - 182 p. : ill. ; 30 cm. 
<br/><br/>Thesis (Doctor of Philosophy) - Universiti Kebangsaan Malaysia, 1995 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Large scale integration