Speckle metrology 
edited by Robert K. Erf. 
 - New York  Academic Press  1978. 
 - xiv, 331 p.   :ill.   ;24 cm. 
 - Quantum electronics--principles and applications. .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0122413601 
<br/><br/><label>LCCN: </label>78-206 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Speckle metrology.