Secondary ion mass spectometry : SIMS VI : proceedings of the sixth international conference on secondary ion mass spectrometry (SMIS VI) : palais des congres, Versailles, Paris, France September 13-18th, 1987 - International Conference on Secondary Ion Mass Spectrometry 1987 : Versailles, France); Benningheven, A. (Chichester : John Wiley & Sons, 1988)
Keywords: Secondary ion mass spectrometry -- Congresses