Lee, Kyungho  <br/><br/>
The reliability of ultrathin silicon dioxide  [microform] / 
Kyungho Lee 
 - Ann Arbor, Mich. :  University Microfilms International,  1993 
 - 2 microfiches ;  11 x 15 cm. 
<br/><br/>Thesis (Ph.D.) - University of Minnesota, 1993 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Silica