TY  - BOOK
AU  - Howes,M.J.
AU  - Morgan,D.V.
TI  - Reliability and degradation: semiconductor devices and circuits
SN  - 0471280283
PY  - 1981///
CY  - Chichester
PB  - John Wiley & Sons
KW  - Semiconductors
KW  - Reliability
ER  -