Rational fault analysis  proceedings of the Symposium on Rational Fault Analysis held at Texas Tech University August 19-20, 1974 
edited by Richard Sacks, Stanley R. Liberty 
 - New York  M. Dekker  1977 
 - ix, 241 p ill 24 cm 
 - Electrical engineering and electronics  1 .
<br/><br/> Co-sponsored by the Office of Naval Research and the Army Research Office  Proceedings of the Symposium on Rational Fault Analysis held at Texas Tech University August 19-20, 1974 
<br/><br/>Includes bibliographies and index 
<br/><br/><label>ISBN: </label>0824765419 
<br/><br/><label>LCCN: </label>76-40363 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic apparatus and appliances--Testing--Congresses<br/>Electronic apparatus and appliances--Reliability--Congresses<br/>Automatic checkout equipment--Congresses