Vinod Narayanan. <br/><br/>
New algorithms for fault simulation and random pattern testing  [microform] / 
by Vinod Narayanan. 
 - Ann Arbor, Mich. :  University Microfilms International,  1989. 
 - 2 microfiches ;  11 X 15 cm. 
<br/><br/>Thesis (Ph.D.)-Syracuse University, 1989. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer algorithms.<br/>Simulation methods.<br/>Algorithms.