Bateson, John <br/><br/>
In-circuit testing / 
by John Bateson 
 - New York :  Van Nostrand Reinhold,  1985 
 - 243p. :  26 cm. 
<br/><br/><label>LCCN: </label>84-27128 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Printed circuits--Testing