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Fundamentals of surface and thin film analysis / by Leonard G. Feldman and James W. Mayer

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Publication details: New York : North-Holland, 1986Description: 352 p. : ill. ; c23 cmISBN:

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Holdings
Item type	Current library	Home library	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	QD506.F39 (Browse shelf(Opens below))		1	Available		00000287952

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