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Digital integrated circuit testing from a quality perspective / Eugene R. Hnatek
Publication details: New York : Van Nostrand Reinhold, 1993Description: 179 p. : ill. ; 23 cmISBN:- 0442006438
| Item type | Current library | Home library | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|
| AM | PERPUSTAKAAN LINGKUNGAN KEDUA | PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA | TK7874.H533 (Browse shelf(Opens below)) | 1 | Available | 00000815214 |
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