Defect analysis in electron microscopy / M. H. Loretto and R. E. Smallman

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Publication details: London : Chapman & Hall, 1975Description: ix, 134 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Home library	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	QD921.L67 (Browse shelf(Opens below))	n.2	1	Available		00000288354
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	QD921.L67 (Browse shelf(Opens below))	n.1	1	Available		00000288348

Includes index

Bibliography: p. 131

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