Amazon cover image
Image from Amazon.com

CMOS SRAM circuit design and parametric test in nano-scaled technologies [electronic resource] : process-aware SRAM design and test / by Andrei Pavlov, Manoj Sachdev.

By: Contributor(s): Series: Frontiers in electronic testing ; 40Publication details: Dordrecht : Springer Science + Business Media B.V, 2008.Description: 212 p. : ill., digital ; 24 cmISBN:
  • 9781402083631 (electronic bk.)
  • 9781402083624 (paper)
Subject(s): DDC classification:
  • 621.38152 22
Online resources: In: Springer eBooks
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
No physical items for this record

There are no comments on this title.

to post a comment.

Contact Us

Perpustakaan Tun Seri Lanang, Universiti Kebangsaan Malaysia
43600 Bangi, Selangor Darul Ehsan,Malaysia
+603-89213446 – Consultation Services
019-2045652 – Telegram/Whatsapp
Email: helpdeskptsl@ukm.edu.my

Copyright ©The National University of Malaysia Library