Characterization of semiconductor materials / Philip F. Kane, Graydon B. Larrabee
Series: Texas instruments electronics seriesPublication details: New York : McGraw-Hill, 1970Description: xvi, 351 p. : ill. ; 26 cmSubject(s):| Item type | Current library | Home library | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|
| AM | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5) | QC612.S4K26 (Browse shelf(Opens below)) | 1 | Available | 00000283045 |
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