Technological and statistical significance of physical test data / by Chen Kwek Kong [et.al.].
Series: RRIM technology bulletin ; no.5Publication details: Kuala Lumpur : Rubber Research Institute, 1980.Description: 30 p. : ill. ; 24 cmISSN:- 0126-9410
| Item type | Current library | Home library | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|
| DOKUMEN | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG DOKUMEN-P. TUN SERI LANANG (ARAS 5) | MK10 RRI 7 T443 1980 (Browse shelf(Opens below)) | bil.5 n.1 | Available | 00001346971 | |||
| DOKUMEN | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG DOKUMEN-P. TUN SERI LANANG (ARAS 5) | MK10 RRI 7 T443 1980 (Browse shelf(Opens below)) | bil.5 n.2 | Available | 00001346972 | |||
| DOKUMEN | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG DOKUMEN-P. TUN SERI LANANG (ARAS 5) | MK10 RRI 7 T443 1980 (Browse shelf(Opens below)) | bil.5 n.3 | 1 | Available | 00002261891 |
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