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Accelerated testing : statistical models, test plans, and data analyses / Wayne Nelson
Series: Wiley series in probability and mathematical statistics. Applied probability and statisticsPublication details: New York : John Wiley & Sons, 1990Description: xiv , 601 p. : ill. ; 25 cmISBN:- 0471522775
| Item type | Current library | Home library | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|
| AM | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5) | QA276.N45 (Browse shelf(Opens below)) | 1 | Available | 00000404985 |
'A Wiley-Interscience publication.'
Includes bibliographical references
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