Applied logistic regression / David W. Hosmer, Stanley Lemeshow.

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Series: Wiley series in probability and statisticsPublication details: New York : John Wiley & Sons, 2000.Edition: 2nd edDescription: xii , 375 p. : ill. ; 25 cmISBN:

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NLM classification:

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Holdings
Item type	Current library	Home library	Call number	Materials specified	Copy number	Status	Barcode
AM	PERPUSTAKAAN DR ABDUL LATIFF	PERPUSTAKAAN DR ABDUL LATIFF KOLEKSI AM-P. DR ABDUL LATIFF	QA278.2.H67 2000 9 (Browse shelf(Opens below))		1	Available	00001112553
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	QA278.2.H67 2000 (Browse shelf(Opens below))	n. 1	1	Available	00001474026
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	QA278.2.H67 2000 (Browse shelf(Opens below))	n. 2	1	Available	00001474027
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	QA278.2.H67 2000 (Browse shelf(Opens below))	n.3	1	Available	00001474028

References : p. 354-367.

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