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High-field reliability of MOS devices

Lee, Jack Chung-Yeung

High-field reliability of MOS devices [microform] / Jack Chung-Yeung Lee - Ann Arbor, Mich. : University Microfilms International, 1989 - 2 microfiches ; 11 x 15 cm.

Thesis (Ph.D.) - University of California, 1988

Subjects--Topical Terms:
Metal oxide semiconductors
Metal oxide semidonductors--Field--effect transistor

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High-field reliability of MOS devices

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