Hierarchical modeling for VLSI circuit testing /
Bhattacharya, Debashis, 1961-
Hierarchical modeling for VLSI circuit testing / by Debashis Bhattacharya and John P. Hayes. - Boston : Kluwer Academic Publishers, 1990 - 159 p. : ill. ; 23 cm.
079239058X RM203.11
Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Computer simulation.
Hierarchical modeling for VLSI circuit testing / by Debashis Bhattacharya and John P. Hayes. - Boston : Kluwer Academic Publishers, 1990 - 159 p. : ill. ; 23 cm.
079239058X RM203.11
Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Computer simulation.