Normal view MARC view ISBD view

The electrical characterization of semiconductors measurement of minority carrier properties

The electrical characterization of semiconductors measurement of minority carrier properties J. W. Orton and P. Blood - New York Academic Press 1992 - 291 p. ; 23 cm. - Techniques of physics 13 .

ISBN: 0125286252 RM88.00

Subjects--Topical Terms:
Semiconductors
Solid state physics

Place hold
Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

The electrical characterization of semiconductors measurement of minority carrier properties

Contact Us

Copyright ©The National University of Malaysia Library