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Electron beam-specimen interactions and simulation methods in microscopy /

Mendis, Budhika G.,

Electron beam-specimen interactions and simulation methods in microscopy / Budhika G. Mendis. - x, 279 pages : illustrations ; 2018. - Royal Microscopical Society - John Wiley series . - Royal Microscopical Society - John Wiley series .

Includes bibliographical references and index.

ISBN: 9781118456095 RM463.68

Subjects--Topical Terms:
Microscopy, Electron.

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Electron beam-specimen interactions and simulation methods in microscopy /

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