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Dimensional stability of low expansivity materials (microform) : time dependent changes in optical contact interfaces and phase shifts on reflection from multilayer dielectrics /

Berthold, John William, III, 1945-

Dimensional stability of low expansivity materials (microform) : time dependent changes in optical contact interfaces and phase shifts on reflection from multilayer dielectrics / by John William Berthold III - Ann Arbor, Mich. : University Microfilms International , 1976 - 1 microfiche ; 11 x 15 cm.

Thesis (Ph.D.)-University of Arizona, 1976

Subjects--Topical Terms:
Steel--Electrometallurgy
Steel--Electric properties

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Dimensional stability of low expansivity materials (microform) : time dependent changes in optical contact interfaces and phase shifts on reflection from multilayer dielectrics /

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