Design for testability of VLSI structures through the use of circuit techniques (microform) /
Oklobdzija, Vojin G.
Design for testability of VLSI structures through the use of circuit techniques (microform) / Vojin G. Oklobdzija - Ann Arbor, Mich. : University Microfilms International , 1982 - 2 microfiches ; 11 x 15 cm.
Thesis (Ph.D.)-University of California, 1982
Integrated circuits--Very large scale integration--Testing
Design for testability of VLSI structures through the use of circuit techniques (microform) / Vojin G. Oklobdzija - Ann Arbor, Mich. : University Microfilms International , 1982 - 2 microfiches ; 11 x 15 cm.
Thesis (Ph.D.)-University of California, 1982
Integrated circuits--Very large scale integration--Testing