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Defect control in semiconductors : proceedings of the international conference on the science and technology of defect control in semiconductors, the Yokohama 21st century forum, Yokohama, Japan September 17-22, 1989 /

Defect control in semiconductors : proceedings of the international conference on the science and technology of defect control in semiconductors, the Yokohama 21st century forum, Yokohama, Japan September 17-22, 1989 / edited by K. Sumino - Amsterdam : North-Holland, 1990 - v.: ill. ; 28 cm.

Includes bibliographical references and indexes

Subjects--Topical Terms:
Semiconductors--Defects--Congresses
Materials--Defects--Congresses

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Defect control in semiconductors : proceedings of the international conference on the science and technology of defect control in semiconductors, the Yokohama 21st century forum, Yokohama, Japan September 17-22, 1989 /

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