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Defect analysis in high-resistivity semiconductors by transient deep-level spectroscopy

Braatz, Paul Otto

Defect analysis in high-resistivity semiconductors by transient deep-level spectroscopy [microform] / by Paul Otto Braatz - Ann Arbor, Mich. : University Microfilms International , 1984 - 5 microfiches ; 11 x 15 cm.

Thesis (Ph.D.) - University of California, 1984

Subjects--Topical Terms:
Semiconductors--Defects

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Defect analysis in high-resistivity semiconductors by transient deep-level spectroscopy

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