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Deep level transient spectroscopy characterization of semiconductors ( microform)

Wei-I, Lee

Deep level transient spectroscopy characterization of semiconductors ( microform) by Wei-I Lee - Ann Arbor, Mich. University Microfilms International 1989 - 3 microfiches ; 11 x 15 cm.

Thesis (Ph.D.) - Rensselaer Polytechnic Institute, 1988

Subjects--Topical Terms:
Semiconductors--Defects

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Deep level transient spectroscopy characterization of semiconductors ( microform)

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