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Micro- and nanoscale phenomena in tribology /

Micro- and nanoscale phenomena in tribology / edited by Yip-Wah Chung. - Boca Raton, FL. : CRC Press, 2012. - ix, 210 p. : ill. ; 24 cm.

Includes bibliographical references and index.

ISBN: 9781439839225 (hbk.) RM445.28

Subjects--Topical Terms:
Tribology.
Nanotechnology.

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