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Development of novel micro-contact based test fixture for integrated circuit final testing

Lam, Zi Yi.

Development of novel micro-contact based test fixture for integrated circuit final testing [microform] / Lam Zi Yi. - Universiti Kebangsaan Malaysia, Bangi : 2012 - 1 microfilm reel : Negative ; 35 mm.

Thesis (M.Sc.) - Universiti Kebangsaan Malaysia, 2010.

References : p. [96]-98.

Subjects--Corporate Names:
Universiti Kebangsaan Malaysia--Dissertations.

Subjects--Topical Terms:
Dissertations, Academic--Malaysia.
Integrated circuits--Testing.
Semiconductors--Testing.

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Development of novel micro-contact based test fixture for integrated circuit final testing

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