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Analysis and design of resilient VLSI circuits mitigating soft errors and process variations /

Garg, Rajesh.

Analysis and design of resilient VLSI circuits mitigating soft errors and process variations / [electronic resource] : by Rajesh Garg, Sunil P. Khatri. - Boston, MA : Springer-Verlag US, 2010. - xxiii, 212 p. : ill., digital ; 25 cm.

ISBN: 9781441909312 (electronic bk.) 9781441909305 (paper)

Subjects--Topical Terms:
Integrated circuits--Very large scale integration.
Engineering.
Circuits and Systems.
Computer-Aided Engineering (CAD, CAE) and Design.

LC Class. No.: TK7874.75 / .G37 2010

Dewey Class. No.: 621.395

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Analysis and design of resilient VLSI circuits mitigating soft errors and process variations /

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