Normal view MARC view ISBD view

New horizons of applied scanning electron microscopy

Shimizu, Kenichi.

New horizons of applied scanning electron microscopy [electronic resource] / by Kenichi Shimizu, Tomoaki Mitani. - Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2010. - 1 online resource (xiv, 179 pages) : illustrations, digital. - Springer Series in Surface Sciences, 45 0931-5195 ; .

ISBN: 9783642031601

Subjects--Topical Terms:
Scanning electron microscopy.
Spectroscopy and Microscopy.
Solid State Physics.
Nanotechnology and Microengineering.
Surfaces and Interfaces, Thin Films.
Measurement Science and Instrumentation.

LC Class. No.: QH212.S3 / S556 2010

Dewey Class. No.: 570.2825

Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

New horizons of applied scanning electron microscopy

Contact Us

Copyright ©The National University of Malaysia Library