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Infrared ellipsometry on semiconductor layer structures : phonons, plasmons, and polaritons /

Schubert, Mathias

Infrared ellipsometry on semiconductor layer structures : phonons, plasmons, and polaritons / Mathias Schubert - Berlin : Springer, 2004 - xi, 193 p. : ill. ; 25 cm. - Springer tracts in modern physics, v. 209 0081-3869 ; .

ISBN: 3540232494 RM662.89 9783540232490

Subjects--Topical Terms:
Ellipsometry
Layer structure (Solids)

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Infrared ellipsometry on semiconductor layer structures : phonons, plasmons, and polaritons /

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