Mechanical stress effect on mosfets of 130 nm technology

Wan Rosmaria Wan Ahmad

Mechanical stress effect on mosfets of 130 nm technology [microform] / Wan Rosmaria binti Wan Ahmad - Bangi : Perpustakaan Tun Seri Lanang, 2010 - 1 microfilm reel ; 35 mm.

Thesis (M.Sc) - Universiti Kebangsaan Malaysia, 2008


Universiti Kebangsaan Malaysia--Dissertations


Dissertations, Academic--Malaysia
Metal oxide semiconductor field-effect transistors
Mechanical wear

Contact Us

Perpustakaan Tun Seri Lanang, Universiti Kebangsaan Malaysia
43600 Bangi, Selangor Darul Ehsan,Malaysia
+603-89213446 – Consultation Services
019-2045652 – Telegram/Whatsapp
Email: helpdeskptsl@ukm.edu.my

Copyright ©The National University of Malaysia Library