Optical inspection of microsystems
Optical inspection of microsystems [electronic resource] /
edited by Wolfgang Osten
- Boca Raton, FL : CRC/Taylor & Francis, c2007
- Optical science and engineering ; 109 .
- Optical science and engineering (Boca Raton, Fla.) ; 109 .
Access to 2http://www.engnetbase.com/ejournals/search/advsearch1.asp3 and type in the title. You may access the full text after you type in the advanced search screen
Includes bibliographical references and index
0849336821 9780849336829
2005-046670
GBA612882 bnb
013375896 Uk
Quality control--Optical methods
Optical detectors--Industrial applications
Microelectronics
670.42/5
Access to 2http://www.engnetbase.com/ejournals/search/advsearch1.asp3 and type in the title. You may access the full text after you type in the advanced search screen
Includes bibliographical references and index
0849336821 9780849336829
2005-046670
GBA612882 bnb
013375896 Uk
Quality control--Optical methods
Optical detectors--Industrial applications
Microelectronics
670.42/5