Defects in microelectronic materials and devices
Defects in microelectronic materials and devices [electronic resource] /
edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf
- Boca Raton : CRC Press, c2009
Access to 2http://www.egnetbase.com/ejournals/search/advsearch1.asp' and type the title. You may access the full text after you type in title in the advanced search screen
Includes bibliographical references and index
9781420043761
2008-018722
Microelectronics--Materials--Testing
Metal oxide semiconductor field-effect transistors--Testing
Integrated circuits--Defects
621.381
Access to 2http://www.egnetbase.com/ejournals/search/advsearch1.asp' and type the title. You may access the full text after you type in title in the advanced search screen
Includes bibliographical references and index
9781420043761
2008-018722
Microelectronics--Materials--Testing
Metal oxide semiconductor field-effect transistors--Testing
Integrated circuits--Defects
621.381