Normal view MARC view ISBD view

Computed electron micrographs and defect identification /

Computed electron micrographs and defect identification / A. K. Head ... [et al.] - Amsterdam : North-Holland, 1973 - x, 400 ; 23 cm. - Defects in crystalline solids ; vol. 7 .

ISBN: 0720417570

LCCN: 72-93092

Subjects--Topical Terms:
Electronic data processing--Metals--Defects
Electronic data processing--Electron microscopy

Place hold
Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

Computed electron micrographs and defect identification /

Contact Us

Copyright ©The National University of Malaysia Library