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Synthetic Polymeric Membranes Characterization by Atomic Force Microscopy /

Khulbe, K. C.

Synthetic Polymeric Membranes Characterization by Atomic Force Microscopy / [electronic resource] : by K. C. Khulbe, C. Y. Feng, Takeshi Matsuura. - Berlin, Heidelberg : Springer-Verlag, 2008. - xvii, 197 p. : ill., digital ; 24 cm. - Springer Laboratory. .

ISBN: 9783540739944 (electronic bk.) 9783540739937 (paper)

Subjects--Topical Terms:
Membranes (Technology)
Inorganic polymers.

LC Class. No.: TP159.M4 / K48 2008

Dewey Class. No.: 660.2842

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Synthetic Polymeric Membranes Characterization by Atomic Force Microscopy /

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