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EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany. Volume 1, Instrumentation and Methods

EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany. Volume 1, Instrumentation and Methods [electronic resource] / edited by Martina Luysberg, Karsten Tillmann, Thomas Weirich. - Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2008. - xxxviii, 862 p. : ill., digital ; 25 cm.

ISBN: 9783540851561 (electronic bk.) 9783540851547 (paper)

Subjects--Topical Terms:
Microscopy--Technique.
Physics.
Physics, general.

Dewey Class. No.: 574.028

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EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany. Volume 1, Instrumentation and Methods

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