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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition /

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition / [electronic resource] : edited by Manoj Sachdev, Jose Pineda de Gyvez. - Boston, MA : Springer, 2007. - 328 p. : ill., digital ; 24 cm. - Frontiers in Electronic Testing, 34 0929-1296 ; .

ISBN: 9780387465470 (electronic bk.)

LC Class. No.: TK7871.99.M44 / S23 2007

Dewey Class. No.: 621.3815

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition /

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