Scanning Microscopy for Nanotechnology Techniques and Applications /
Scanning Microscopy for Nanotechnology Techniques and Applications / [electronic resource] :
edited by Weilie Zhou, Zhong Lin Wang.
- New York, NY : Springer Science+Business Media, LLC, 2007.
- xiv, 522 p., [12] p. of plates : ill. (some col.), digital ; 24 cm.
9780387396200 (electronic bk.)
Scanning electron microscopy.
Nanotechnology.
Chemistry.
Nanotechnology.
Characterization and Evaluation of Materials.
Optical and Electronic Materials.
Measurement Science, Instrumentation.
570
9780387396200 (electronic bk.)
Scanning electron microscopy.
Nanotechnology.
Chemistry.
Nanotechnology.
Characterization and Evaluation of Materials.
Optical and Electronic Materials.
Measurement Science, Instrumentation.
570