Modeling and Analysis of Transient Processes in Open Resonant Structures New Methods and Techniques /
Sirenko, Yuriy K.
Modeling and Analysis of Transient Processes in Open Resonant Structures New Methods and Techniques / [electronic resource] : by Yuriy K. Sirenko, Nataliya P. Yashina, Staffan Strom. - New York, NY : Springer, 2007. - xiv, 353 p. : ill., digital ; 25 cm. - Springer Series in Optical Sciences, 122 0342-4111 ; .
9780387325774 (electronic bk.) 9780387308784 (paper)
Electromagnetic waves--Scattering--Mathematical models.
Physics.
Mathematical and Computational Physics.
Applied Optics, Optoelectronics, Optical Devices.
Microwaves, RF and Optical Engineering.
Information and Communication, Circuits.
Modeling and Analysis of Transient Processes in Open Resonant Structures New Methods and Techniques / [electronic resource] : by Yuriy K. Sirenko, Nataliya P. Yashina, Staffan Strom. - New York, NY : Springer, 2007. - xiv, 353 p. : ill., digital ; 25 cm. - Springer Series in Optical Sciences, 122 0342-4111 ; .
9780387325774 (electronic bk.) 9780387308784 (paper)
Electromagnetic waves--Scattering--Mathematical models.
Physics.
Mathematical and Computational Physics.
Applied Optics, Optoelectronics, Optical Devices.
Microwaves, RF and Optical Engineering.
Information and Communication, Circuits.