Design for Manufacturability and Yield for Nano-Scale CMOS

Chiang, Charles C.

Design for Manufacturability and Yield for Nano-Scale CMOS [electronic resource] / by Charles C. Chiang, Jamil Kawa. - Dordrecht : Springer, 2007. - 154 p. : ill., digital ; 24 cm. - Series on Integrated Circuits and Systems, 1558-9412 .

9781402051883 (electronic bk.)

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