Normal view MARC view ISBD view

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces /

Kaupp, G.

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces / [electronic resource] : by Gerd Kaupp. - Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2006. - xii, 292 p. : ill., digital ; 24 cm.

ISBN: 9783540284727 (electronic bk.)

Subjects--Topical Terms:
Genomics--Congresses.
Pharmacogenomics--Congresses.
Drug development--Congresses.
Chemistry.
Nanotechnology.
Physics and Applied Physics in Engineering.
Applied Optics, Optoelectronics, Optical Devices.
Medical Biochemistry.
Physical Chemistry.
Life Sciences, general.

LC Class. No.: QH212.A78 / K38 2006

Dewey Class. No.: 502.82

Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces /

Contact Us

Copyright ©The National University of Malaysia Library