Applied Scanning Probe Methods. Characterization / III
Applied Scanning Probe Methods. Characterization / III [electronic resource] :
edited by Bharat Bhushan, Harald Fuchs.
- Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2006.
- xliii, 378 p. : ill., digital ; 24 cm.
- NanoScience and Technology, 1434-4904 .
9783540269106 (electronic bk.)
Scanning probe microscopy.
Scanning probe microscopy--Industrial applications.
Materials--Microscopy.
Chemistry.
Nanotechnology.
Surfaces and Interfaces, Thin Films.
Analytical Chemistry.
Physical Chemistry.
Polymer Sciences.
Solid State Physics and Spectroscopy.
502.82
9783540269106 (electronic bk.)
Scanning probe microscopy.
Scanning probe microscopy--Industrial applications.
Materials--Microscopy.
Chemistry.
Nanotechnology.
Surfaces and Interfaces, Thin Films.
Analytical Chemistry.
Physical Chemistry.
Polymer Sciences.
Solid State Physics and Spectroscopy.
502.82